Identification of Failure Inducing Combinations using Greedy Heuristic Algorithm

Abstract

The successful eminence of Combinatorial Testing can be realized with effective techniques for Fault Localization (FL). This paper presents an effective FL technique that can accurately determine the Failure Inducing Combinations (FICs) using a greedy heuristic approach. The importance of this technique comes from the fact that when an executed test suite is given as input, it localizes the FICs by catering to all-t-way combinations while generating Test Cases based on their probability of passing. The initial study and experimentation are found to be promising, providing scope for rigorous empirical study.